The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 29, 2013

Filed:

Oct. 29, 2010
Applicants:

Thai V. Truong, Pasadena, CA (US);

John M. Choi, Tujunga, CA (US);

Scott E. Fraser, LaCanada, CA (US);

Willy Supatto, Paris, FR;

David S. Koos, Pasadena, CA (US);

Inventors:

Thai V. Truong, Pasadena, CA (US);

John M. Choi, Tujunga, CA (US);

Scott E. Fraser, LaCanada, CA (US);

Willy Supatto, Paris, FR;

David S. Koos, Pasadena, CA (US);

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G02B 21/06 (2006.01); G02B 21/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

An apparatus for and method of performing light sheet microscopy (LISH) and light scanning microscopy (RAPS) in a single device are provided. The dual-mode imaging microscope allows for the use of both LISH and RAPS in a single instrument. This dual-mode device will allow researchers to have access to both types of microscopy, allowing access to the widest possible selection of samples. In addition, the device will reduce the high costs and space requirements associated with owning two different microscopes (LISH and RAPS).


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