Company Filing History:
Years Active: 2007-2012
Title: Innovator Spotlight: David Paul Lappas
Introduction:
David Paul Lappas, a skilled inventor residing in Hamilton, OH, has made significant contributions to the field of measurement devices and inspection technology. With a total of 2 patents to his name, his innovative solutions have revolutionized the way machine components are assessed for quality and performance.
Latest Patents:
1. Method and system for integrating eddy current inspection with a coordinate measuring device: Lappas' groundbreaking method involves combining eddy current capabilities with coordinate measuring machine (CMM) functionalities to create an integrated inspection probe. This probe facilitates the measurement of external and internal boundaries, defects, surface conditions, and material properties of machine components. The inspection data can be effortlessly synchronized with CAD models for accurate comparison to nominal requirements.
2. Two dimensional phased arrays for volumetric ultrasonic inspection and methods of use: Lappas' second patent showcases the application of a two-dimensional ultrasonic phased array for material and volumetric component testing. This innovative array offers electronic adjustments for focal properties and aperture size in multiple directions, ensuring uniform sound field characteristics throughout the component under evaluation.
Career Highlights:
David Paul Lappas is currently affiliated with General Electric Corporation Gmbh, where his inventive mind continues to drive advancements in the industry. His tenure at this esteemed corporation has been marked by a series of pioneering inventions that have garnered recognition for their practicality and efficiency.
Collaborations:
In his creative endeavors, Lappas has collaborated with accomplished professionals such as Thomas James Batzinger and James Norman Barshinger. This collaborative spirit has not only enriched his projects but has also led to the development of groundbreaking solutions that are shaping the future of inspection technologies.
Conclusion:
David Paul Lappas' dedication to innovation and his relentless pursuit of excellence have established him as a trailblazer in the realm of measurement devices and inspection methodologies. His patents stand as a testament to his ingenuity and unwavering commitment to pushing the boundaries of technological advancement in the field.