The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 04, 2007
Filed:
Oct. 16, 2003
James Norman Barshinger, Scotia, NY (US);
Thomas James Batzinger, Burnt Hills, NY (US);
Wei LI, Bothell, WA (US);
John Broddus Deaton, Jr., Niskayuna, NY (US);
David Paul Lappas, Hamilton, OH (US);
Robert Snee Gilmore, Charlton, NY (US);
Richard Eugene Klaassen, West Chester, OH (US);
Michael John Danyluk, Waukesha, WI (US);
Patrick Joseph Howard, Cincinnati, OH (US);
David Charles Copley, Loveland, OH (US);
James Norman Barshinger, Scotia, NY (US);
Thomas James Batzinger, Burnt Hills, NY (US);
Wei Li, Bothell, WA (US);
John Broddus Deaton, Jr., Niskayuna, NY (US);
David Paul Lappas, Hamilton, OH (US);
Robert Snee Gilmore, Charlton, NY (US);
Richard Eugene Klaassen, West Chester, OH (US);
Michael John Danyluk, Waukesha, WI (US);
Patrick Joseph Howard, Cincinnati, OH (US);
David Charles Copley, Loveland, OH (US);
General Electric Company, Niskayuna, NY (US);
Abstract
The present disclosure provides for the application of a two-dimensional ultrasonic phased array (), formed of a plurality of transducers () arranged in a rectilinear pattern, for material and volumetric component testing. The two-dimensional array enables electronic adjustment of the focal properties and size of the aperture in both the azimuthal and elevational directions such that uniform and/or specified sound field characteristics can be obtained at any or all locations in the component being tested.