General Electric Company

David Paul Lappas

Thomas James Batzinger

Nicholas Joseph Kray

John Broddus Deaton, Jr

Robert S Gilmore

Francis Howard Little

Changting Wang

James Norman Barshinger

Patrick Joseph Howard

Richard Eugene Klaassen

Wei Li

Yanyan Wu

Haiyan Sun

Michael John Danyluk

David M Dombrowski

David Charles Copley

A method for integrating a measurement device for use in measuring a machine component includes providing a coordinate measuring machine (CMM) and combining eddy current (EC) capabilities and CMM capabilities to form an inspection probe. The method further includes installing the inspection probe on the CMM so that the inspection probe measures external boundaries of the machine component with the CMM capabilities and substantially simultaneously measures at least one of internal boundaries, internal defects, surface defects, and material properties of the machine component with the EC capabilities, which are directly linked to actual component dimensional information provided by CMM. The inspection data can be simultaneously linked to and/or displayed with a CAD model to enable a direct comparison between the inspection data and the nominal requirements specified on the CAD model.

Method and system for integrating eddy current inspection with a coordinate measuring device

The present disclosure provides for the application of a two-dimensional ultrasonic phased array (), formed of a plurality of transducers () arranged in a rectilinear pattern, for material and volumetric component testing. The two-dimensional array enables electronic adjustment of the focal properties and size of the aperture in both the azimuthal and elevational directions such that uniform and/or specified sound field characteristics can be obtained at any or all locations in the component being tested.

Two dimensional phased arrays for volumetric ultrasonic inspection and methods of use

Growing community of inventors

Hamilton, OH, United States of America

David Paul Lappas