The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 15, 2012

Filed:

Feb. 18, 2009
Applicants:

Yanyan Wu, Schenectady, NY (US);

Thomas James Batzinger, Burnt Hills, NY (US);

Nicholas Joseph Kray, Blue Ash, OH (US);

Changting Wang, Niskayuna, NY (US);

Haiyan Sun, Niskayuna, NY (US);

Francis Howard Little, Cincinnati, OH (US);

David Paul Lappas, Hamilton, OH (US);

David Michael Dombrowski, Loveland, OH (US);

Inventors:

Yanyan Wu, Schenectady, NY (US);

Thomas James Batzinger, Burnt Hills, NY (US);

Nicholas Joseph Kray, Blue Ash, OH (US);

Changting Wang, Niskayuna, NY (US);

Haiyan Sun, Niskayuna, NY (US);

Francis Howard Little, Cincinnati, OH (US);

David Paul Lappas, Hamilton, OH (US);

David Michael Dombrowski, Loveland, OH (US);

Assignee:

General Electric Company, Niskayuna, NY (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 27/82 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method for integrating a measurement device for use in measuring a machine component includes providing a coordinate measuring machine (CMM) and combining eddy current (EC) capabilities and CMM capabilities to form an inspection probe. The method further includes installing the inspection probe on the CMM so that the inspection probe measures external boundaries of the machine component with the CMM capabilities and substantially simultaneously measures at least one of internal boundaries, internal defects, surface defects, and material properties of the machine component with the EC capabilities, which are directly linked to actual component dimensional information provided by CMM. The inspection data can be simultaneously linked to and/or displayed with a CAD model to enable a direct comparison between the inspection data and the nominal requirements specified on the CAD model.


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