Cupertino, CA, United States of America

David Overhauser

This inventor holds 13 USPTO granted patents. Top assignees: Cadence Design Systems, Inc., Other. Active years: 2005-2013.


% Patents Active = 61.5

Average Co-Inventor Count = 2.4

ph-index = 6

Forward Citations = 104(Granted Patents)


Location History:

  • Sunnyvale, CA (US) (2005)
  • Cupertino, CA (US) (2006 - 2013)

Company Filing History:


Years Active: 2005-2013

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13 patents (USPTO):Explore Patents

Title: David Overhauser: Innovator in Power Distribution Analysis

Introduction

David Overhauser is a prominent inventor based in Cupertino, CA (US). He has made significant contributions to the field of electrical verification of integrated circuits. With a total of 13 patents to his name, Overhauser has established himself as a key figure in the innovation landscape.

Latest Patents

One of his latest patents is a method and system for power distribution analysis. This patent discloses systems and methods for the electrical verification of integrated circuits. The methodologies described focus on the verification of the power and ground distribution systems (PDS) for system-on-a-chip (SoC) designs. Additionally, it addresses the verification of the interaction of the PDS with the behavior of integrated circuits.

Career Highlights

Overhauser has worked with notable companies, including Cadence Design Systems, Inc. His experience in these organizations has allowed him to refine his expertise in power distribution analysis and integrated circuit verification.

Collaborations

Throughout his career, Overhauser has collaborated with esteemed professionals in the field, including Steven L. Teig and Akira Fujimura. These collaborations have further enriched his work and contributed to his innovative projects.

Conclusion

David Overhauser's contributions to the field of electrical verification and power distribution analysis have made a lasting impact. His innovative methodologies and collaborations continue to influence the industry.

Profile summary based on public USPTO records.
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