Company Filing History:
Years Active: 1993-2007
Title: The Innovations of David Menis
Introduction
David Menis is a notable inventor based in Cohasset, MA (US). He has made significant contributions to the field of electronic testing, holding a total of five patents. His work focuses on developing advanced testing solutions that enhance the efficiency and accuracy of electronic devices.
Latest Patents
One of David Menis's latest inventions is the Single Platform Electronic Tester. This innovative device integrates digital, analog, and memory test circuitry on a single platform. The tester is designed to connect to a device under test, which can include various types of integrated circuits such as system-on-a-chip, mixed signal, digital, or analog integrated circuits. The digital test circuitry applies digital test signals and receives corresponding digital outputs, while the analog test circuitry does the same for analog signals. Additionally, the memory test circuitry applies memory test patterns and receives memory outputs. A supervising tester computer manages the application of these test signals, allowing for a flexible testing approach that can utilize solely digital, solely analog, solely memory, or a combination of all three types of signals. This comprehensive testing solution operates seamlessly as a single platform.
Career Highlights
David Menis is currently employed at LTX Corporation, where he continues to innovate in the field of electronic testing. His expertise and inventions have significantly impacted the industry, providing advanced solutions for testing electronic devices.
Collaborations
Throughout his career, David has collaborated with talented individuals such as Phillip D. Burlison and Kenneth J. Lanier. These collaborations have contributed to the development of cutting-edge technologies in electronic testing.
Conclusion
David Menis is a distinguished inventor whose work in electronic testing has led to the creation of innovative solutions like the Single Platform Electronic Tester. His contributions continue to shape the future of electronic device testing, showcasing the importance of innovation in technology.