The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 06, 1993
Filed:
Sep. 06, 1991
David Menis, Cohasset, MA (US);
Harold S Vitale, Los Gatos, CA (US);
Phillip D Burlison, Morgan Hill, CA (US);
William R DeHaven, Los Altos, CA (US);
LTX Corporation, Westwood, MA (US);
Abstract
An apparatus for a test system for testing an electronic circuit. The apparatus includes an interconnect path, a comparator, a programmable apparatus, a first Schottky diode, and a second Schottky diode. The interconnect path has a first end and a second end. The first end of the interconnect path is coupled to the electronic circuit under test. The interconnect path transmits a signal from the electronic circuit under test to the second end of the interconnect path. The comparator is coupled to the second end of the interconnect path for receiving and comparing the signal from the electronic circuit under test with a reference voltage. The comparator has a high input impedance. The comparator provides an output signal to the test system. The programmable apparatus provides a selectable first voltage and a selectable second voltage. A first Schottky diode is provided for reducing ringing of the signal from the electronic circuit under test. A first end of the first Schottky diode is coupled to the interconnect path at a point near the comparator. A second end of the first Schottky diode is coupled to the selectable first voltage. A second Schottky diode is provided for reducing ringing of the signal from the electronic circuit under test. A first end of the second Schottky diode is coupled to the selectable second voltage. The second end of the second Schottky diode is coupled to the interconnect path at a point near the comparator.