Company Filing History:
Years Active: 2010
Title: David Larochelle: Innovator in Non-Destructive Inspection Technology
Introduction
David Larochelle is a notable inventor based in California, recognized for his contributions to the field of non-destructive inspection technology. With a focus on enhancing the efficiency of inspection instruments, he has developed innovative solutions that have significant implications for various industries.
Latest Patents
David holds a patent for a "Multiple mode digitization system for a non-destructive inspection instrument." This invention utilizes a multiplexing circuit and a single set of analog to digital converters to efficiently digitize analog test signals from multiple inputs. The system is designed to drive each analog to digital converter with an independent clock signal, allowing for propagation delay compensation among the test signals. This innovative approach enables interleaved sampling, allowing custom sampling rates for each input without requiring more than one clock frequency. In an alternate embodiment, phase adjustments on the sampling clocks are utilized for interleave sampling, with digital filters providing signal propagation delay compensation.
Career Highlights
David Larochelle is currently employed at Olympus NDT, where he applies his expertise in developing advanced inspection technologies. His work has contributed to the company's reputation as a leader in non-destructive testing solutions.
Collaborations
Throughout his career, David has collaborated with talented professionals, including Michael Drummy and Andrew Thomas. These partnerships have fostered innovation and enhanced the development of cutting-edge technologies in the field.
Conclusion
David Larochelle's innovative contributions to non-destructive inspection technology exemplify the impact of dedicated inventors in advancing industry standards. His patent and work at Olympus NDT highlight the importance of innovation in creating efficient and effective inspection solutions.