The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 19, 2010
Filed:
Aug. 15, 2008
Michael Drummy, North Reading, MA (US);
Andrew Thomas, Westford, MA (US);
Denys Laquerre, Quebec, CA;
David Larochelle, Quebec, CA;
Pierre Langlois, Quebec, CA;
Steven Besser, Framingham, MA (US);
Michael Drummy, North Reading, MA (US);
Andrew Thomas, Westford, MA (US);
Denys Laquerre, Quebec, CA;
David Larochelle, Quebec, CA;
Pierre Langlois, Quebec, CA;
Steven Besser, Framingham, MA (US);
Olympus NDT, Waltham, MA (US);
Abstract
A multiple mode digitization system for a non-destructive inspection instrument which makes use of a multiplexing circuit and a single set of analog to digital converters to efficiently digitize analog test signals from a plurality of inputs. In the preferred embodiment, each of the analog to digital converters in the system is driven with an independent and separate clock signal, allowing for propagation delay compensation among the plurality of test signals as well as interleaved sampling such that custom sampling rates can be used for each input without the need for more than one clock frequency. In an alternate embodiment, phase adjustments on the sampling clocks are used only for interleave sampling, and digital filters are used to provide signal propagation delay compensation.