David L Ganapol

Title: David L Ganapol: Innovator in Testing Technologies

Introduction

David L Ganapol is a prominent inventor based in Scotts Valley, CA (US). He has made significant contributions to the field of testing technologies, holding a total of 6 patents. His work focuses on enhancing the efficiency and effectiveness of testing devices, particularly in semiconductor applications.

Latest Patents

Ganapol's latest patents include innovative designs such as the "Multi-test type probe card and corresponding testing system for parallel testing of dies via multiple test sites." This probe card is designed for testing dies of a substrate during a wafer sort process. It features a printed circuit board (PCB) and a test site that connects to one of the dies during a test cycle. The design allows for a first type of test to be performed on a die using a specific pin configuration, optimizing the testing process. Another notable patent is the "Heat sink blade pack for device under test testing." This apparatus is configured to engage a device for testing via automatic test equipment. It includes a heat sink with multiple fins and a vacuum path that allows for effective engagement with the device being tested.

Career Highlights

Throughout his career, David L Ganapol has worked with notable companies such as VLSI Technology, Inc. and Marvell Asia Pte., Ltd. His experience in these organizations has contributed to his expertise in the field of testing technologies.

Collaborations

Ganapol has collaborated with several professionals in his field, including Gary L Small and Scott Wu. These collaborations have likely enriched his work and led to further innovations in testing technologies.

Conclusion

David L Ganapol is a distinguished inventor whose contributions to testing technologies have made a significant impact in the industry. His innovative patents and career achievements reflect his dedication to advancing the field.