David J Sturtevant

Title: Innovations of David J Sturtevant

Introduction

David J Sturtevant is a notable inventor based in Gresham, OR (US). He holds a total of 6 patents that showcase his contributions to the field of technology and integrated circuits. His work has significantly impacted the way images are printed on wafers and how integrated circuit properties are visualized.

Latest Patents

One of his latest patents is a method for optimizing wafer edge patterning. This innovative method involves printing an image on a wafer, which includes steps for printing a main image that is fully on the wafer and an alternate image that is only partially on the wafer. The alternate image can be placed on a separate mask or inserted on the same mask for that layer. Another significant patent is the yield profile manipulator, which presents a graphical profile map for integrated circuits on a substrate. This map includes die placement boundaries and shot placement boundaries, along with integrated circuit property information contours. By presenting this information graphically, it becomes easier to interpret which placements are at risk and which have adequate property profiles.

Career Highlights

Throughout his career, David has worked with prominent companies such as LSI Corporation and LSI Logic Corporation. His experience in these organizations has allowed him to develop and refine his innovative ideas, contributing to advancements in the technology sector.

Collaborations

David has collaborated with notable individuals in his field, including Bruce Joseph Whitefield and Duane B Barber. These collaborations have likely enriched his work and led to further innovations.

Conclusion

David J Sturtevant's contributions to the field of technology through his patents and collaborations highlight his role as a significant inventor. His innovative methods for wafer patterning and integrated circuit visualization continue to influence the industry.