Helsinki, Finland

David Gunnarsson

USPTO Granted Patents = 2 

 

Average Co-Inventor Count = 7.0

ph-index = 1

Forward Citations = 1(Granted Patents)


Company Filing History:


Years Active: 2021-2022

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2 patents (USPTO):Explore Patents

Title: David Gunnarsson: Innovator in Integrated Circuit Testing

Introduction

David Gunnarsson is a notable inventor based in Helsinki, Finland. He has made significant contributions to the field of integrated circuit testing, holding a total of 2 patents. His work focuses on developing advanced testing devices that enhance the efficiency and accuracy of testing integrated circuits on wafers.

Latest Patents

Gunnarsson's latest patents include a sophisticated testing device designed for electrically testing integrated circuits on a wafer. This innovative device features a vacuum chamber, a chuck for holding the wafer, and a probe card for electrically contacting the integrated circuits. Additionally, it incorporates a radiation shield arranged inside the vacuum chamber, enclosing both the chuck and the probe card. The device is equipped with a gate valve, a hatch on the radiation shield, and a wafer loading assembly that facilitates the loading of the wafer onto the chuck through the gate valve and hatch. Another patent focuses on a testing device that includes radiation shields for testing integrated circuits on a wafer, comprising a cooling unit thermally connected to the first radiation shield.

Career Highlights

Throughout his career, David Gunnarsson has worked with several prominent companies, including Afore Oy and Bluefors Cryogenics Oy. His experience in these organizations has allowed him to refine his skills and contribute to groundbreaking innovations in the field of integrated circuit testing.

Collaborations

Gunnarsson has collaborated with talented individuals such as Aki Junes and Ari Kuukkala. These partnerships have fostered a creative environment that has led to the development of advanced technologies in the industry.

Conclusion

David Gunnarsson is a distinguished inventor whose work in integrated circuit testing has made a significant impact on the field. His innovative patents and collaborations with industry professionals highlight his commitment to advancing technology.

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