This inventor holds 2 USPTO granted patents. Top assignee: Tokyo Electron Limited. Active years: 2007.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 2007
Title: David Fatke: Innovator in Semiconductor Manufacturing
Introduction
David Fatke is a notable inventor based in Austin, TX, specializing in advancements within the semiconductor manufacturing industry. He holds 2 patents that reflect his expertise and innovative approach to technology.
Latest Patents
One of his latest patents is titled "Method and apparatus for endpoint detection using partial least squares." This invention provides an apparatus and method for detecting feature etch completion within an etching reactor. The method involves determining a correlation matrix by recording first measured data regarding a first etch process over successive time intervals to form a first recorded data matrix. It also includes assembling a first endpoint signal matrix using target endpoint data for a specific etch process, performing a partial least squares analysis on the recorded data matrix and the first endpoint signal matrix to refine the recorded data matrix, and computing a correlation matrix based on the refined recorded data matrix and the first endpoint signal matrix. Furthermore, the method entails performing a second etch process to form a second recorded data matrix, where the correlation matrix and the second recorded data matrix are analyzed to determine whether the endpoint of the second etch process has been achieved.
Another significant patent is the "Method for automatic configuration of processing system." This method focuses on automatically configuring an Advanced Process Control (APC) system for a semiconductor manufacturing environment. It involves generating an auto-configuration script for executing an auto-configuration program, which activates default values for input. The script is executed to produce an enabled parameter file output from the auto-configuration program, identifying parameters for statistical process control (SPC) chart generation.
Career Highlights
David Fatke is currently employed at Tokyo Electron Limited, where he contributes to the development of cutting-edge technologies in semiconductor manufacturing. His work has significantly impacted the efficiency and effectiveness of manufacturing processes.
Collaborations
Throughout his career, David has collaborated with talented individuals such as Hongyu Henry Yue and Hieu A Lam, enhancing the innovation landscape within his field.
Conclusion
David Fatke's contributions to semiconductor manufacturing through his patents and work at Tokyo Electron Limited highlight his role as a key innovator in the industry. His inventions continue to pave the way for advancements in technology and manufacturing processes.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
