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Boise, ID, United States of America

David D Siek

USPTO Granted Patents = 13

Average Co-Inventor Count = 1.4

ph-index = 8

Forward Citations = 312(Granted Patents)

Location History:

Bosie, ID (US) (2003)
Boise, ID (US) (1999 - 2007)

Company Filing History:

13 out of 37,905

Micron Technology Incorporated

Years Active: 1999-2007

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13 patents (USPTO):Sort by Forward CitationsExplore Patents

1. 7180802 - Method of stress-testing an isolation gate in a dynamic random access memory (2007-02-20),

2. 6999362 - Method of stress-testing an isolation gate in a dynamic random access memory (2006-02-14),

3. 6930503 - System for testing integrated circuit devices (2005-08-16),

4. 6870750 - DRAM array and computer system (2005-03-22),

5. 6756805 - System for testing integrated circuit devices (2004-06-29),

6. 6735132 - 6F2 DRAM array with apparatus for stress testing an isolation gate and method (2004-05-11),

7. 6590817 - 6F2 DRAM array with apparatus for stress testing an isolation gate and method (2003-07-08),

8. 6510533 - Method for detecting or repairing intercell defects in more than one array of a memory device (2003-01-21),

9. 6496027 - System for testing integrated circuit devices (2002-12-17),

10. 6167541 - Method for detecting or preparing intercell defects in more than one (2000-12-26),

11. 6066870 - Single digit line with cell contact interconnect (2000-05-23),

12. 5986955 - Method and apparatus for hiding data path equilibration time (1999-11-16),

13. 5866928 - Single digit line with cell contact interconnect (1999-02-02),

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