David B Owen

Title: The Innovations of David B. Owen

Introduction

David B. Owen is a notable inventor based in Carmel, IN (US), recognized for his contributions to technology with a total of nine patents to his name. His work primarily focuses on systems and methods that enhance the efficiency and accuracy of various processes in the semiconductor industry.

Latest Patents

One of his latest patents is titled "System and method for determining post bonding overlay." This innovative wafer shape metrology system includes a sub-system designed to perform stress-free shape measurements on both a first and second wafer, as well as a post-bonding pair of these wafers. The system features a controller that receives measurements and predicts overlay between features on the wafers, providing feedback adjustments to process tools based on these predictions. Another significant patent is the "Compliance inspection system and method," which includes an interface for communicating inspection assignments to inspectors. This system verifies the inspector's location and receives documentation related to the inspection, ensuring compliance and accuracy in the inspection process.

Career Highlights

Throughout his career, David B. Owen has worked with various companies, including Kla Corporation, where he has applied his expertise in developing innovative solutions. His contributions have significantly impacted the field of metrology and compliance inspection.

Collaborations

David has collaborated with notable professionals in his field, including Mark Davis Smith and Xiaomeng Shen. Their combined efforts have led to advancements in technology and improved methodologies in their respective areas of expertise.

Conclusion

David B. Owen's innovative work and patents reflect his commitment to advancing technology in the semiconductor industry. His contributions continue to influence the field, showcasing the importance of innovation in driving progress.