Company Filing History:
Years Active: 2003-2004
Title: The Innovations of David A. Schwarten
Introduction
David A. Schwarten is an accomplished inventor based in Ellicott City, MD (US). He has made significant contributions to the field of optical testing, holding a total of three patents. His work focuses on enhancing the efficiency and effectiveness of optical module testing systems.
Latest Patents
One of Schwarten's latest patents is titled "Method and apparatus for performing parallel asynchronous testing of optical modules." This invention utilizes state machines implemented in a common controller to perform parallel asynchronous testing on multiple optical modules. The method allows operators to select desired optical tests while ensuring that necessary resources, such as COM ports and testing instruments, are available. If a resource is not available, the test is placed in queues to await availability, thereby optimizing the testing process.
Another notable patent is the "Optical module testing system," which includes a variety of optical signal sources and degradation elements that communicate with input switches. This system is designed to conduct a range of optical tests on multiple modules simultaneously. A controller supervises the entire process, utilizing a database of test recipes to manage the optical signal sources, input switches, and test equipment effectively.
Career Highlights
David A. Schwarten is currently employed at Ciena Corporation, where he continues to innovate in the field of optical technology. His work has significantly impacted the efficiency of optical testing processes, making them more streamlined and effective.
Collaborations
Throughout his career, Schwarten has collaborated with notable colleagues, including Bryan Coin and Michael J. Ransford. These partnerships have contributed to the development of advanced optical testing solutions.
Conclusion
David A. Schwarten's contributions to optical testing technology through his patents and work at Ciena Corporation highlight his role as a leading inventor in this field. His innovative methods and systems continue to advance the capabilities of optical module testing.
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