The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 13, 2004
Filed:
Jan. 11, 2001
Bryan Coin, Campbell, CA (US);
Michael J. Ransford, Millersville, MD (US);
David A. Schwarten, Ellicott City, MD (US);
Chao Jiang, Ellicott City, MD (US);
Iqbal M. Dar, Marriottsville, MD (US);
Andrei Csipkes, Alpharetta, GA (US);
Ciena Corporation, Linthicum, MD (US);
Abstract
A system for conducting optical tests on a plurality of optical modules includes a plurality of optical signal sources and optical signal degradation elements optically communicating with input switches. The input switches sources supply optical test signals to optical modules (units under test) plugged into a common shelf. Output optical switches supply the output signals to a range of optical test equipment. A controller utilizes a database of test recipes to supervise and control the optical signal sources, optical signal degradation elements, units under test, input switches, output switches, and test equipment to conduct a variety of optical tests on the modules. With this architecture it is possible to subject a variety of different optical modules to a variety of different optical tests.