This inventor holds 1 USPTO granted patent and 2 published patent applications. Top assignee: Nova Corporation. Active years: 2026.
Company Filing History:
Years Active: 2026
Title: Daphna Peimer: Innovator in Semiconductor Metrology
Introduction
Daphna Peimer is a prominent inventor based in Rehovot, Israel. She has made significant contributions to the field of semiconductor device metrology. Her innovative work focuses on enhancing the accuracy and efficiency of measurements in semiconductor technology.
Latest Patents
Daphna Peimer holds 1 patent for her invention titled "Time-domain optical metrology and inspection of semiconductor devices." This patent involves a sophisticated method of creating a time-domain representation of wavelength-domain measurement data of light reflected by a patterned structure of a semiconductor device. The process includes selecting relevant and irrelevant portions of the time-domain representation and determining measurements of parameters of interest through model-based processing.
Career Highlights
Daphna is currently employed at Nova Corporation, where she applies her expertise in semiconductor technology. Her work has been instrumental in advancing the field and improving the performance of semiconductor devices.
Collaborations
Daphna collaborates with notable colleagues, including Gilad Barak and Amir Sagiv. Their combined efforts contribute to the innovative environment at Nova Corporation.
Conclusion
Daphna Peimer's contributions to semiconductor metrology exemplify her dedication to innovation and excellence in technology. Her work continues to influence the industry and pave the way for future advancements.