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For the Inventor, By the Inventor

Palo Alto, CA, United States of America

Daniel Yves Abramovitch

This inventor holds 27 USPTO granted patents and 1 published patent application, primarily in Scanning Probe Microscopy. Top assignees: Agilent Technologies, Inc., Hewlett-Packard Development Company, L.p., Hewlett-Packard Company. Active years: 1995-2022.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Daniel Yves Abramovitch. Retrieved from https://idiyas.com/inventor/daniel-yves-abramovitch

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

USPTO Granted Patents = 27 

% Patents Active = 51.9

Average Co-Inventor Count = 1.5

ph-index = 7

Forward Citations = 166(Granted Patents)


Location History:

  • Santa Clara, CA (US) (1995)
  • Loveland, CO (US) (2016)
  • Palo Alto, CA (US) (1997 - 2022)

Company Filing History:

goldMedal12 out of 4,730 
 
Agilent Technologies, Inc.
 patents
silverMedal6 out of 27,667 
 
Hewlett-Packard Development Company, L.p.
 patents
bronzeMedal3 out of 9,639 
 
Hewlett-Packard Company
 patents
4. 2 out of 599 
 
Keysight Technologies, Inc.
 patents
5. 1 out of 55 
 
Avago Technologies General IP Pte, Ltd.
 patents
6. 1 out of 17 
 
Sensor Platforms, Inc.
 patents
7. 2 out of 834,453 
Other
 patents

Years Active: 1995-2022

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Areas of Expertise:
Mass Spectrometry
Atomic Force Microscope
Digital Filters
Optical Disk
Scanning Probe Microscopes
PID Parameters
Nano Position Sensing
Phase-Locked Loops
Bit Error Rate Tester
Tire Pressure Monitoring
Drive Error Signal
Synchronous Detection
27 patents (USPTO):Explore Patents
1. 11244818 - Method for finding species peaks in mass spectrometry (2022-02-08),
2. 9678103 - Automatic tuning of atomic force microscope (2017-06-13),
3. 9391590 - Cascaded digital filters with reduced latency (2016-07-12),
4. RE45292 - Re-writable optical disk having reference clock information permanently formed on the disk (2014-12-15),
5. 8370961 - Providing a topographic signal of sample using atomic force microscope (2013-02-05),
6. RE43788 - Re-writable optical disk having reference clock information permanently formed on the disk (2012-11-05),
7. 8074291 - Harmonic correcting controller for a scanning probe microscope (2011-12-06),
8. 7987006 - Automatic generation of PID parameters for a scanning probe microscope (2011-07-26),
9. 7843627 - Coherent demodulation with reduced latency adapted for use in scanning probe microscopes (2010-11-30),
10. RE41881 - Re-writable optical disk having reference clock information permanently formed on the disk (2010-10-25),
11. 7768738 - Mitigating the effects of disturbances of a disk drive (2010-08-03),
12. 7701836 - Re-writable optical disk having reference clock information permanently formed on the disk (2010-04-20),
13. 7683567 - Method for improving scanning probe microscope imaging by inverse filtering (2010-03-23),
14. 7607343 - System for nano position sensing in scanning probe microscopes using an estimator (2009-10-27),
15. 7472585 - Method for rapid seeks to the measurement surface for a scanning probe microscope (2009-01-06),

Title: **Daniel Yves Abramovitch: Innovator in Mass Spectrometry and Microscopy**

Introduction

Daniel Yves Abramovitch is a prominent inventor based in Palo Alto, California, holding an impressive portfolio of 27 patents. His work primarily revolves around advanced techniques in mass spectrometry and atomic force microscopy, contributing significantly to the fields of data processing and analytical instrumentation.

Latest Patents

Some of Abramovitch's latest patents demonstrate his innovative approach to complex scientific challenges. One notable patent is for a **Method for Finding Species Peaks in Mass Spectrometry**. This invention introduces a method for a data processing system used to identify peaks in a mass spectrum based on the abundances of species according to their mass-to-charge ratios. The method involves selecting a candidate blob with multiple peaks and characterizing one peak by fitting it to a species peak model, ultimately refining the analysis by subtracting overlapping peaks.

Another significant patent is the **Automatic Tuning of Atomic Force Microscope**. This patent outlines a methodology for tuning an atomic force microscope through automatic loop shaping. By adjusting the controller's gain in response to the loop response’s frequency characteristics, the system can enhance the performance of the AFM, allowing for more precise measurements.

Career Highlights

Throughout his career, Abramovitch has made substantial contributions while working with esteemed organizations such as Agilent Technologies, Inc. and the Hewlett-Packard Development Company, L.P. His career has been marked by a commitment to innovation and excellence in technology development.

Collaborations

Collaboration plays a vital role in the success of inventors like Abramovitch. He has had the privilege of working alongside notable colleagues, including David K. Towner and Carl Philip Taussig, who have contributed to his projects and research goals.

Conclusion

Daniel Yves Abramovitch is a distinguished inventor whose patents reflect a deep understanding of complex scientific principles and a drive for innovation. His contributions to mass spectrometry and atomic force microscopy not only advance technology but also pave the way for future breakthroughs in analytical instrumentation.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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