Taipei, Taiwan

Daniel Stanley Young Tan

This inventor holds 3 USPTO granted patents. Top assignees: Inventec (Pudong) Technology Corporation, Inventec Corp.. Active years: 2021-2023.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Daniel Stanley Young Tan. Retrieved from https://idiyas.com/inventor/daniel-stanley-young-tan

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 4.0

ph-index = 1

Forward Citations = 1(Granted Patents)


Company Filing History:


Years Active: 2021-2023

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3 patents (USPTO):Explore Patents

Title: The Innovative Contributions of Daniel Stanley Young Tan

Introduction

Daniel Stanley Young Tan is a prominent inventor based in Taipei, Taiwan. He has made significant contributions to the field of image processing and defect detection, holding a total of three patents. His work focuses on developing methods that enhance image reconstruction and improve defect detection processes.

Latest Patents

One of his latest patents is a "Method for Generating a Reconstructed Image." This method is designed to adapt to an input image containing a target object. It involves converting the input image into a feature map with vectors through an encoder. The process includes training with reference images to generate and store feature prototypes in memory. By selecting parts of these prototypes based on similarities, the method generates a similar feature map and converts it into a reconstructed image using a decoder. This innovative approach utilizes an auto-encoder framework.

Another notable patent is the "Method for Training a Defect Detector." This method begins with obtaining a reference image of an object with a defect, which is labeled accordingly. It involves training a reconstruction model with a second reference image of a related object that has a tolerable defect level. The method generates a second label for a target image and trains a defect detector using a machine learning algorithm based on the reference and target images. This approach enhances the accuracy of defect detection in various applications.

Career Highlights

Daniel has worked with notable companies such as Inventec Technology Corporation and Inventec Corporation. His experience in these organizations has allowed him to apply his innovative ideas in practical settings, contributing to advancements in technology.

Collaborations

Throughout his career, Daniel has collaborated with talented individuals, including Yi-Chun Chen and Trista Pei-Chun Chen. These collaborations have fostered a creative environment that has led to the development of impactful technologies.

Conclusion

Daniel Stanley Young Tan's contributions to image processing and defect detection are noteworthy. His innovative patents reflect his commitment to advancing technology in these fields. His work continues to influence the industry and inspire future innovations.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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