The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 26, 2022
Filed:
Jun. 19, 2020
Inventec (Pudong) Technology Corporation, Shanghai, CN;
Inventec Corporation, Taipei, TW;
Yi-Chun Chen, Taipei, TW;
Trista Pei-Chun Chen, Taipei, TW;
Daniel Stanley Young Tan, Taipei, TW;
Wei-Chao Chen, Taipei, TW;
INVENTEC (PUDONG) TECHNOLOGY CORPORATION, Shanghai, CN;
INVENTEC CORPORATION, Taipei, TW;
Abstract
A method for training a defect detector comprises: obtaining a first reference image of a first reference object, wherein the first reference object has a defect and the first reference image has a first label indicating the defect; training a reconstruction model according to a second reference image of a second reference object associated with the first reference object, wherein a defect level of the second reference object is in a tolerable range with an upper limit; obtaining a target image of a target object associated with the first reference object and the second reference object; generating a second label according to the target image, the reconstruction model and an error calculation procedure, wherein the second label comprises a defect of the target object; and training a defect detector by performing a machine learning algorithm according to the first reference image, the target image and the second label.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile