The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 16, 2021

Filed:

Jun. 18, 2020
Applicants:

Inventec (Pudong) Technology Corporation, Shanghai, CN;

Inventec Corporation, Taipei, TW;

Inventors:

Yi-Chun Chen, Taipei, TW;

Trista Pei-Chun Chen, Taipei, TW;

Daniel Stanley Young Tan, Taipei, TW;

Wei-Chao Chen, Taipei, TW;

Assignees:
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/62 (2006.01);
U.S. Cl.
CPC ...
G06K 9/6256 (2013.01); G06K 9/6232 (2013.01); G06K 9/6262 (2013.01); G06K 2209/21 (2013.01);
Abstract

A method for labeling image comprises: obtaining a target image of a target object; generating a reconstruction image according to the target image and a reconstruction model, wherein the reconstruction model is trained with a plurality of reference images and a machine learning algorithm, each of the reference images is an image of a reference object whose defect level is in a tolerable range with an upper limit, and each of the reference objects is associated with the target object; generating a first difference image and a second difference image respectively by performing a first difference algorithm and a second difference algorithm respectively according to the target image and the reconstruction image; and generating an output image by performing a pixel-scale operation according to the first difference image and the second difference image, wherein the output image includes a label indicating a defect of the target object.


Find Patent Forward Citations

Chen, Yi-Chun. (2021). Method for labeling image (U.S. Patent No. 11176419). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/11176419

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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