Rehovot, Israel

Daniel I Some


Average Co-Inventor Count = 1.3

ph-index = 6

Forward Citations = 139(Granted Patents)


Location History:

  • Rehovot, IL (2005)
  • Ashdod, IL (2004 - 2010)

Company Filing History:


Years Active: 2004-2010

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12 patents (USPTO):Explore Patents

Title: The Innovative Contributions of Daniel I Some

Introduction

Daniel I Some is a prominent inventor based in Rehovot, Israel, known for his significant contributions to the field of optical inspection systems. With a total of 12 patents to his name, he has developed groundbreaking technologies that enhance defect detection in substrates.

Latest Patents

Among his latest patents is the "Multi-detector defect detection system and a method for detecting defects." This innovative method inspects substrates for defects by obtaining at least two wafer element detection signals, each reflecting light scattered in distinct directions. The process involves calculating wafer element attribute values and determining relationships with reference values to indicate the presence of defects. Another notable patent is the "High speed laser scanning inspection system," which utilizes a coherent laser beam to rapidly evaluate substrates. This system employs picosecond or femtosecond pulses from a modelocked laser source, focusing on multiple spots on the substrate without producing mutually interfering coherence effects.

Career Highlights

Daniel has worked with leading companies in the industry, including Applied Materials Israel Limited and Applied Materials, Inc. His experience in these organizations has allowed him to refine his skills and contribute to the advancement of optical inspection technologies.

Collaborations

Throughout his career, Daniel has collaborated with notable professionals such as Silviu Reinhorn and Gilad Almogy, further enhancing his innovative capabilities and expanding his impact in the field.

Conclusion

Daniel I Some's work exemplifies the spirit of innovation in the realm of defect detection and optical inspection systems. His patents and career achievements reflect a commitment to advancing technology and improving substrate inspection methods.

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