This inventor holds 3 USPTO granted patents. Top assignee: Intel Corporation. Active years: 2004-2008.
Company Filing History:
Years Active: 2004-2008
Title: Dan Murray - Innovator in Integrated Circuit Testing
Introduction
Dan Murray is a notable inventor based in Hillsboro, OR (US). He has made significant contributions to the field of integrated circuits, holding a total of 3 patents. His work focuses on improving the testing methods for leakage current in integrated circuits, which is crucial for ensuring the reliability and performance of electronic devices.
Latest Patents
One of Dan's latest patents is titled "AC testing of leakage current in integrated circuits using RC time constant." This invention includes apparatus and systems that utilize integrated circuits. The terminals or pins of these integrated circuits are designed to be driven to a state, floated for a specific time interval, and then measured to determine the state of the terminals after this interval. The measurement process involves sampling the RC time constant of the leakage current of the terminals. Another embodiment of this patent describes a method of testing an integrated circuit, which includes applying a voltage to one of the pins, floating the pin for a predetermined time, and performing a measurement that samples the RC time constant of the leakage current.
Career Highlights
Dan Murray is currently employed at Intel Corporation, a leading technology company known for its innovations in semiconductor manufacturing. His work at Intel has allowed him to develop and refine his patented technologies, contributing to the advancement of integrated circuit testing.
Collaborations
Throughout his career, Dan has collaborated with talented individuals such as Tawfik Arabi and Gregory F Taylor. These collaborations have fostered an environment of innovation and have led to the development of cutting-edge technologies in the field.
Conclusion
Dan Murray's contributions to integrated circuit testing through his patents and work at Intel Corporation highlight his role as an influential inventor in the technology sector. His innovative methods for testing leakage current are paving the way for advancements in electronic device reliability.