The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 22, 2005
Filed:
Jul. 12, 2004
Applicants:
Tawfik R. Arabi, Tigard, OR (US);
Gregory F. Taylor, Portland, OR (US);
Srirama Pedaria, Portland, OR (US);
Patrick Elwer, Hillsboro, OR (US);
Dan Murray, Hillsboro, OR (US);
Inventors:
Tawfik R. Arabi, Tigard, OR (US);
Gregory F. Taylor, Portland, OR (US);
Srirama Pedaria, Portland, OR (US);
Patrick Elwer, Hillsboro, OR (US);
Dan Murray, Hillsboro, OR (US);
Assignee:
Intel Corporation, Santa Clara, CA (US);
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R031/02 ;
U.S. Cl.
CPC ...
Abstract
A method of testing an integrated circuit includes applying a voltage to one of the pins of the integrated circuit. The pin is floated for a predetermined time. A measurement is performed after the predetermined time. The measurement involves sampling the RC time constant of leakage current of the pins.