This inventor holds 3 USPTO granted patents and 4 published patent applications. Top assignees: Tokyo Electron Limited, Dainippon Screen Mfg. Co., Ltd.. Active years: 1991-2011.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Location History:
- Kamigyo-ku, JP (2009)
- Kyoto, JP (1991 - 2011)
Company Filing History:
2 out of 10,904 
1 out of 1,306 
Years Active: 1991-2011
Title: Daiki Kurihara: Innovator in Semiconductor Inspection Technologies
Introduction
Daiki Kurihara is a prominent inventor based in Kyoto, Japan. He has made significant contributions to the field of semiconductor inspection technologies, holding a total of 3 patents. His innovative approaches have enhanced the reliability and accuracy of semiconductor wafer inspections.
Latest Patents
One of Kurihara's latest patents is an inspection method and program for inspecting electrical characteristics of a semiconductor wafer. This method allows for high-reliability inspections, even for very fine and thin-film electrode pads. It utilizes needle traces formed on the electrode pads, enabling precise contact with probes. The control unit of the inspection apparatus manages the process, ensuring that each probe contacts the electrode pads accurately.
Another notable patent is related to a probing apparatus and a positional deviation acquiring method. In this invention, a post-contact image is captured after a probe contacts a pad with an existing probe mark. The system compares this post-contact image with a pre-contact image to determine the position of the latest probe mark region. This allows for the identification of any positional deviations in the contact between the probe and the pad.
Career Highlights
Throughout his career, Daiki Kurihara has worked with leading companies in the semiconductor industry, including Tokyo Electron Limited and Dainippon Screen Manufacturing Co., Ltd. His experience in these organizations has contributed to his expertise in semiconductor technologies and innovations.
Collaborations
Kurihara has collaborated with notable professionals in the field, including Satoshi Sano and Hiromi Chaya. These collaborations have further enriched his work and contributed to advancements in semiconductor inspection methods.
Conclusion
Daiki Kurihara's contributions to semiconductor inspection technologies demonstrate his innovative spirit and dedication to enhancing industry standards. His patents reflect a commitment to improving the reliability and accuracy of semiconductor inspections, making a significant impact in the field.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile