Kirkwood, MO, United States of America

Craig Spohr

This inventor holds 2 USPTO granted patents. Top assignee: Memc Electronic Materials, Inc.. Active years: 2001-2003.


% Patents Active = 50.0

Average Co-Inventor Count = 3.7

ph-index = 2

Forward Citations = 13(Granted Patents)


Company Filing History:


Years Active: 2001-2003

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2 patents (USPTO):Explore Patents

Title: Craig Spohr: Innovator in Semiconductor Technology

Introduction

Craig Spohr is a notable inventor based in Kirkwood, MO (US). He has made significant contributions to the field of semiconductor technology, holding a total of 2 patents. His work focuses on improving processes related to semiconductor wafer cleaning and drying.

Latest Patents

Craig Spohr's latest patents include a "Method of calibrating a semiconductor wafer drying apparatus" and an "Apparatus for cleaning semiconductor wafers." The first patent describes a method for calibrating a semiconductor wafer drying apparatus that involves selecting a test heater temperature and processing time. This method ensures that semiconductor wafers are effectively enveloped by a solvent vapor cloud during the drying process. The second patent outlines a device designed for cleaning semiconductor wafers, featuring a carrier that holds the wafers securely while minimizing contaminants. The innovative design of the carrier includes grooves that retain the wafers in place during cleaning and transportation.

Career Highlights

Craig Spohr is associated with Memc Electronic Materials, Inc., where he applies his expertise in semiconductor technology. His work has contributed to advancements in the efficiency and effectiveness of wafer processing.

Collaborations

Some of Craig's coworkers include Philip R Schmidt and James C Lenk, who have likely collaborated with him on various projects within the semiconductor industry.

Conclusion

Craig Spohr's innovative patents and contributions to semiconductor technology highlight his role as a key inventor in this field. His work continues to influence the efficiency of semiconductor manufacturing processes.

Profile summary based on public USPTO records.
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