This inventor holds 1 USPTO granted patent. Top assignee: Mks Instruments, Inc.. Active years: 2006.
Company Filing History:
Years Active: 2006
Title: The Innovations of Clifford C. Weatherell
Introduction
Clifford C. Weatherell is a notable inventor based in Rochester, NY (US). He has made significant contributions to the field of RF metrology, particularly in the plasma processing industry. With a focus on enhancing the serviceability and installation of RF metrology systems, Weatherell's work has paved the way for advancements in this specialized area.
Latest Patents
Weatherell holds a patent for "RF metrology characterization for field installation and serviceability for the plasma processing industry." This innovative system allows for the field substitution of components within an RF metrology system. The system comprises a sensor/cable combination and an analysis unit. Prior to field deployment, parameters of the RF metrology system are determined. This enables either the cable/sensor combination or the analysis module to be substituted in the field, with recalibration based on the pre-determined parameters.
Career Highlights
Clifford C. Weatherell has dedicated his career to advancing RF metrology technologies. His work at MKS Instruments, Inc. has been instrumental in developing systems that enhance the efficiency and reliability of plasma processing applications. His innovative approach has led to the successful implementation of his patented technology in various field settings.
Collaborations
Weatherell has collaborated with several professionals in his field, including Kevin P. Nasman and David J. Coumou. These collaborations have contributed to the development and refinement of RF metrology systems, further enhancing their applicability in the industry.
Conclusion
Clifford C. Weatherell's contributions to RF metrology have significantly impacted the plasma processing industry. His innovative patent and collaborative efforts demonstrate his commitment to advancing technology in this specialized field.
