Location History:
- Austin, TX (US) (1997 - 1999)
- Travis, TX (US) (1999)
Company Filing History:
Years Active: 1997-1999
Title: Clark Gilson Shepard: Innovator in Embedded Memory Testing
Introduction
Clark Gilson Shepard is a notable inventor based in Austin, TX (US). He has made significant contributions to the field of embedded memory testing, holding a total of 4 patents. His work primarily focuses on enhancing the reliability and efficiency of memory arrays in integrated circuits.
Latest Patents
One of Shepard's latest patents is titled "Multiple BIST controllers for testing multiple embedded memory arrays." This invention involves tightly coupling multiple memory arrays to their own Built-In Self-Test (BIST) controllers, allowing for structural and retention testing. The testing process is initiated by common signals, and the results are combined to generate global DONE and HOLD signals. This innovative approach enables the testing of multiple BISTed memories while adhering to power limitations.
Another significant patent is the "Method and apparatus for performing operative testing on an integrated circuit." This method detects defective CMOS devices by analyzing quiescent current (IDDQ) behavior using a monitor circuit integrated into the expendable areas of a die or wafer. The monitor unit determines defective die based on the decay of voltage over time, providing a reliable testing mechanism for integrated circuits.
Career Highlights
Clark Gilson Shepard has had a distinguished career at Motorola Corporation, where he has applied his expertise in embedded systems and memory testing. His innovative contributions have played a crucial role in advancing the technology used in integrated circuits.
Collaborations
Shepard has collaborated with notable colleagues, including Alfred Larry Crouch and Matthew D Pressly. These partnerships have fostered a collaborative environment that encourages innovation and the development of cutting-edge technologies.
Conclusion
Clark Gilson Shepard's work in embedded memory testing has significantly impacted the field of integrated circuits. His patents reflect a commitment to innovation and excellence, making him a valuable contributor to the technology landscape.