Plano, TX, United States of America

Clarence W Teng

This inventor holds 37 USPTO granted patents, primarily in Dynamic RAM Technology. Top assignee: Texas Instruments Corporation. Active years: 1985-1999.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Clarence W Teng. Retrieved from https://idiyas.com/inventor/clarence-w-teng

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 2.1

ph-index = 15

Forward Citations = 717(Granted Patents)


Location History:

  • Dallas, TX (US) (1991)
  • Plano, TX (US) (1985 - 1999)

Company Filing History:


Years Active: 1985-1999

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Areas of Expertise:
Dynamic RAM
Capacitor Structures
Isolation Processes
Trench Memory Cell
High Density DRAM
Latch-Up Resistant CMOS
Transistor Fabrication
Substrate Bias
Memory Cell Design
Integrated Circuit
Defect Free Fabrication
Microplanarization
37 patents (USPTO):Explore Patents

Title: The Innovative Journey of Clarence W Teng

Introduction: Clarence W Teng, a visionary inventor based in Plano, TX, has made significant contributions to the field of technology through his groundbreaking inventions and patents.

Latest Patents: Clarence W Teng holds several patents in various technological domains, showcasing his versatility and creativity in innovation.

Career Highlights: With a career spanning over two decades, Clarence W Teng has established himself as a leading figure in the tech industry, known for his ability to transform ideas into tangible inventions that have real-world applications.

Collaborations: Throughout his career, Clarence W Teng has collaborated with top research institutions, universities, and leading tech companies to further his innovative projects and bring them to fruition.

Conclusion: Clarence W Teng's passion for innovation, coupled with his dedication to pushing the boundaries of technology, has solidified his reputation as a pioneering inventor in Plano, TX, and beyond.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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