Tainan, Taiwan

Chung-Yi Lee

This inventor holds 2 USPTO granted patents. Top assignee: Taiwan Semiconductor Manufacturing Comp. Ltd.. Active years: 2000-2010.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Chung-Yi Lee. Retrieved from https://idiyas.com/inventor/chung-yi-lee-c5o2evkf

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 50.0

Average Co-Inventor Count = 3.0

ph-index = 2

Forward Citations = 27(Granted Patents)


Location History:

  • Chupei, TW (2000)
  • Tainan, TW (2010)

Company Filing History:


Years Active: 2000-2010

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2 patents (USPTO):Explore Patents

Title: Innovations of Chung-Yi Lee

Introduction

Chung-Yi Lee is a notable inventor based in Tainan, Taiwan. He has made significant contributions to the field of semiconductor technology, particularly in the design and development of innovative apparatuses for wafer handling and defect detection. With a total of 2 patents to his name, his work has had a considerable impact on the industry.

Latest Patents

One of Chung-Yi Lee's latest patents is titled "Paddle for securely mounting a wafer cassette holder thereto." This invention provides a platform designed to securely mount a wafer cassette holder, featuring a flat bottom surface and four sidewall panels. The platform includes a flat top surface larger than the bottom surface of the holder, along with a securing device to prevent accidental slipping. The securing device may consist of engagement pins or side panels that ensure the holder remains stable during use.

Another significant patent is the "Apparatus for detecting wafer edge defects and method of using." This apparatus utilizes an ultrasonic detection unit to identify crazing or micro-cracks in a wafer edge, while a laser detection unit is employed to detect larger cracks. The detection module is designed to operate in clean room conditions and can be positioned adjacent to process machines within a fab plant. This compact apparatus is essential for ensuring the quality and integrity of wafers during various processing steps.

Career Highlights

Chung-Yi Lee is currently associated with Taiwan Semiconductor Manufacturing Company Limited, a leading player in the semiconductor industry. His work at this prestigious company has allowed him to contribute to advancements in wafer technology and defect detection.

Collaborations

Chung-Yi Lee has collaborated with notable colleagues, including Ching-Chiang Chang and Yu-Yen Chang. These collaborations have further enhanced the innovative capabilities within their projects.

Conclusion

Chung-Yi Lee's contributions to semiconductor technology through his patents and work at Taiwan Semiconductor Manufacturing Company Limited highlight his role as a key innovator in the field. His inventions are paving the way for advancements in wafer handling and defect detection, ensuring higher quality standards in semiconductor manufacturing.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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