Chung-Long Pan

Title: Inventor Chung-Long Pan: Advancing Defect Detection Technologies

Introduction

Chung-Long Pan is an accomplished inventor based in Kaohsiung, Taiwan, recognized for his innovative contributions to defect detection technologies. With a total of four patents to his name, Pan has significantly impacted the field of microelectronics, particularly regarding 3D chip architecture and multilayer daisy chain structures.

Latest Patents

Among his latest inventions are two cutting-edge patents focused on defect detection methods. The first patent, titled "Defect detection method for multilayer daisy chain structure and system using the same," outlines a comprehensive process for identifying defects in multilayer daisy chain configurations. This process includes generating various physical models with defects based on specific defect types, utilizing machine learning techniques to create a classifier, and evaluating the accuracy of defect detection through comparative measures.

The second patent, "Defect detection method for 3D chip and system using the same," addresses the detection of defects within 3D chip designs. This method mirrors the techniques in his first patent, involving the production of physical models with defect types and the implementation of machine learning algorithms to ensure accurate defect identification in complex chip layouts.

Career Highlights

Chung-Long Pan's career is prominently defined by his role at I-Shou University, where he contributes to research and development in electronic engineering and related fields. His work has not only earned him multiple patents but also recognition among his peers for innovative problem-solving in semiconductors and microelectronics.

Collaborations

Throughout his career, Pan has collaborated closely with fellow researchers Yu-Jung Huang and Mei-Hui Guo. Their teamwork has fostered a collective environment where ideas flourish, leading to advancements in defect detection methodologies and improved technologies within the industry.

Conclusion

Chung-Long Pan's innovative spirit and dedication to research have made him a noteworthy figure in defect detection technologies. His contributions through patented inventions continue to leave a lasting impact on the microelectronics field, paving the way for future advancements and smarter electronic solutions.