Chung-Chu Chang

Title: Innovations of Chung-Chu Chang

Introduction

Chung-Chu Chang is a prominent inventor based in Taipei, Taiwan. He has made significant contributions to the field of image calibration and resonant frequency identification, holding a total of eight patents. His work has advanced the technology used in various applications, particularly in imaging and measurement.

Latest Patents

Chung-Chu Chang's latest patents include a "Method for Image Calibration and Apparatus for Image Acquiring." This invention relates to calibrating the image formation position of an image acquiring unit based on its relative location to an objective lens. The method ensures that a clear and sharp interferogram is obtained for three-dimensional surface profile measurement. Additionally, it allows for two-dimensional defect detection and dimension measurement without interference fringes outside the coherent range.

Another notable patent is the "Method and Apparatus for Resonant Frequency Identification through Out-of-Plane Displacement Detection." This invention involves detecting out-of-plane displacement by analyzing fringe density indexes derived from interference images of a vibrating sample. The method enables the identification of resonant frequencies, allowing for the reconstruction of the full-field vibratory surface profile of the sample in various resonance modes.

Career Highlights

Chung-Chu Chang has worked with esteemed organizations such as the Industrial Technology Research Institute and the National Taipei University of Technology. His experience in these institutions has contributed to his innovative research and development efforts.

Collaborations

Chung-Chu Chang has collaborated with notable colleagues, including Jin-Liang Chen and Liang-Chia Chen. Their teamwork has fostered advancements in their respective fields.

Conclusion

Chung-Chu Chang's contributions to innovation in image calibration and resonant frequency identification highlight his expertise and dedication to advancing technology. His patents reflect a commitment to enhancing measurement techniques and improving imaging processes.