Chun-Tai Lien

Title: Innovations of Chun-Tai Lien in Vibration Measurement Technology.

Introduction

Chun-Tai Lien is a notable inventor based in Taipei County, Taiwan. He has made significant contributions to the field of vibration measurement technology. His innovative approach has led to the development of a unique method for determining vibration displacement and frequency.

Latest Patents

Chun-Tai Lien holds a patent for a "Method for determining vibration displacement and vibrating frequency and apparatus using the same." This exemplary method involves determining vibration displacement in interferometric scanning. It utilizes two optical signals with a phase difference to detect a high-coherence interferogram corresponding to a tested surface. The method measures a series of shifting displacements over time to determine the vibrating frequency of the tested surface through spectrum analysis. Additionally, the patent discloses an interferometric apparatus that calculates the relative position between the tested surface and the reference plane, compensating for environmental vibrations to obtain accurate surface profiles and vibration frequencies.

Career Highlights

Throughout his career, Chun-Tai Lien has worked with esteemed organizations such as the Industrial Technology Research Institute and the National Taipei University of Technology. His experience in these institutions has allowed him to refine his skills and contribute to advancements in technology.

Collaborations

Chun-Tai Lien has collaborated with notable colleagues, including Jin-Liang Chen and Liang-Chia Chen. Their teamwork has fostered innovation and development in their respective fields.

Conclusion

Chun-Tai Lien's contributions to vibration measurement technology exemplify the impact of innovative thinking in engineering. His patent and career achievements highlight the importance of research and collaboration in advancing technological solutions.