Taoyuan, Taiwan

Chu-Lung Huang

This inventor holds 1 USPTO granted patent. Top assignee: Win Semiconductors Corp.. Active years: 2025.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Chu-Lung Huang. Retrieved from https://idiyas.com/inventor/chu-lung-huang

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 2.0

ph-index = 1


Company Filing History:


Years Active: 2025

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1 patent (USPTO):Explore Patents

Title: Innovations of Chu-Lung Huang in Semiconductor Technology

Introduction

Chu-Lung Huang is a notable inventor based in Taoyuan, Taiwan. He has made significant contributions to the field of semiconductor technology. His work focuses on enhancing the reliability and performance of semiconductor devices.

Latest Patents

One of his key patents is titled "Semiconductor structure for die crack detection." This invention provides a III-V semiconductor die designed specifically for die crack detection. The semiconductor die includes a device area and features a doped semiconductor ring region that surrounds this area. Within the device area, at least one active device or passive device is formed, showcasing the innovative design and functionality of his work.

Career Highlights

Chu-Lung Huang is currently employed at Win Semiconductors Corp., where he continues to advance semiconductor technologies. His expertise and innovative mindset have positioned him as a valuable asset in the industry.

Collaborations

He collaborates with talented individuals, including his coworker Pi-Hsia Wang, to drive forward the development of cutting-edge semiconductor solutions.

Conclusion

Chu-Lung Huang's contributions to semiconductor technology, particularly through his patent for die crack detection, highlight his role as an influential inventor in the field. His work continues to impact the industry positively.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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