Ketzin, Germany

Christopher Schulz

This inventor holds 1 USPTO granted patent. Top assignee: Pac Tech - Packaging Technologies Gmbh. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Christopher Schulz. Retrieved from https://idiyas.com/inventor/christopher-schulz-8wvyulkk

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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Average Co-Inventor Count = 1.0


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Christopher Schulz: Innovator in Test Contact Technology

Introduction

Christopher Schulz is a notable inventor based in Ketzin, Germany. He has made significant contributions to the field of test contact technology. His innovative approach has led to the development of a unique device that enhances the handling of test contacts.

Latest Patents

Christopher Schulz holds a patent for a "Device for handling a test contact." This device features a contact head equipped with a test contact receptacle at its contact end. The receptacle includes a positioning unit with at least two, preferably three, positioning surfaces designed to ensure accurate positioning of the test contact. The design incorporates a base contact surface and additional edge contact surfaces, facilitating precise alignment. Furthermore, the patent outlines a manufacturing system for creating a test contact arrangement specifically for testing semiconductor components.

Career Highlights

Christopher Schulz is currently employed at Pac Tech - Packaging Technologies GmbH. His work at this company has allowed him to focus on advancing technologies related to semiconductor testing. His dedication to innovation is evident in his patent and the impact it has on the industry.

Collaborations

Christopher collaborates with his coworker, Andreas Meinecke, to further enhance their projects and drive innovation within their field.

Conclusion

Christopher Schulz is a pioneering inventor whose work in test contact technology is shaping the future of semiconductor testing. His contributions are invaluable to the industry, and his patent reflects his commitment to innovation.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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