The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 28, 2026

Filed:

Mar. 20, 2024
Applicant:

Pac Tech—packaging Technologies Gmbh, Nauen, DE;

Inventors:

Thorsten Krause, Hoppegarten, DE;

Andreas Meinecke, Berlin, DE;

Christopher Schulz, Ketzin, DE;

Wladimir Motorin, Kremmen, DE;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 1/067 (2006.01); G01R 1/04 (2006.01); G01R 1/073 (2006.01); G01R 3/00 (2006.01); G01R 31/28 (2006.01);
U.S. Cl.
CPC ...
G01R 1/06733 (2013.01); G01R 3/00 (2013.01);
Abstract

A device for handling a test contact in which the device includes a contact head provided with a test contact receptacle at its contact end, the test contact receptacle having a positioning unit having at least two, preferably three, positioning surfaces for coming into positioning contact with a test contact and for positioning the test contact relative to the contact end of the contact head. The at least one positioning surface of the positioning unit being formed as a base contact surface and at least one more positioning surface of the positioning unit being formed as an edge contact surface. Furthermore, a manufacturing system is also provided for manufacturing a test contact arrangement for testing semiconductor components.


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Krause, Thorsten. (2026). Device for handling a test contact (U.S. Patent No. 12693311). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12693311

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