This inventor holds 1 USPTO granted patent and 2 published patent applications. Top assignee: Intel Corporation. Active years: 2026.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 2026
Title: Christopher Morgan and Wafer-Level Electron Beam Probing.
Introduction
Christopher Morgan is an inventor associated with Portland, Oregon, and Intel Corporation. His patent work concerns wafer-level testing and electron-beam imaging of fabricated device structures.
Latest Patents
Morgan is credited with 1 patent: “Wafer Level Electron Beam Prober.” The patent describes systems, devices, and techniques for testing a fabricated die while it remains on a wafer. A probe contacts one side of the die to provide test signals, while electron-beam imaging examines that same side during testing.
Career Highlights
Morgan’s listed invention addresses wafer-level testing, enabling electrical signals to be applied to a die while its structure is imaged. The available information associates him with Intel Corporation.
Collaborations
Xianghong Tong and Martin Von Haartman are identified as Morgan’s coworkers. The provided information does not specify their roles in the patent or the invention.
Conclusion
Christopher Morgan’s patent highlights an approach to combining electrical testing and electron-beam imaging at the wafer level, with his work associated with Intel Corporation.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile