Christopher James Stephens

Title: Christopher James Stephens: Innovator in Electron Backscatter Diffraction

Introduction

Christopher James Stephens is a notable inventor based in West Sussex, GB. He has made significant contributions to the field of electron backscatter diffraction, holding a total of 2 patents. His work focuses on methods and systems that enhance the analysis of materials at a microscopic level.

Latest Patents

One of his latest patents is titled "Methods and apparatus for electron backscatter diffraction sample characterisation." This innovative method involves analyzing a sample imaged by electron backscatter diffraction. It includes identifying a plurality of Kikuchi bands in an electron backscatter diffraction image and forming vector representations based on the sample's position. The configuration of the sample is determined by matching these vector representations with expected sets.

Another significant patent is "Methods and systems for acquiring electron backscatter diffraction patterns." This patent outlines various methods for acquiring electron backscatter diffraction patterns. It describes a process where a charged particle beam is directed towards multiple impact points within a region of interest (ROI). The method calculates the signal quality of each impact point and performs a second scan if the signal quality falls below a certain threshold. This approach allows for the formation of a structural image of the sample based on detected particles from both scans.

Career Highlights

Throughout his career, Christopher has worked with reputable companies such as FEI Company and VG Systems Limited. His experience in these organizations has contributed to his expertise in electron backscatter diffraction technologies.

Collaborations

Christopher has collaborated with notable professionals in his field, including Pavel Stejskal and Austin Penrose Day. These collaborations have further enriched his work and innovations.

Conclusion

Christopher James Stephens is a distinguished inventor whose contributions to electron backscatter diffraction have advanced the field significantly. His patents reflect a deep understanding of material analysis, showcasing his innovative spirit and dedication to research.