This inventor holds 1 USPTO granted patent and 1 EPO patent. Top assignee: Nxp USA, Inc.. Active years: 2022.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 2022
Title: The Innovations of Christophe Athanassiou
Introduction
Christophe Athanassiou is a notable inventor based in Saint-Laurent du Var, France. He has made significant contributions to the field of integrated circuits, particularly in the development of methods for performing built-in self-test (BIST) procedures. His work is characterized by a focus on enhancing the functionality and reliability of radio circuits.
Latest Patents
Athanassiou holds a patent for an integrated circuit and a method of performing a BIST procedure. This innovative integrated circuit includes a plurality of radio circuits and a sophisticated switching network designed to facilitate the BIST procedure. The switching network comprises various components, including combiners, transmitter connection switches, and receiver connection switches. These elements work together to route signals effectively, allowing for both parallel and sequential testing of the radio circuit components. A diagnostic mode is also incorporated, enhancing the testing capabilities of the integrated circuit.
Career Highlights
Christophe Athanassiou is currently employed at NXP USA, Inc., where he continues to push the boundaries of technology in integrated circuits. His expertise in the field has positioned him as a valuable asset to his company and the broader technological community.
Collaborations
Athanassiou collaborates with talented professionals such as Estelle Nguyen and Jerome Mallet. Their combined efforts contribute to the advancement of innovative solutions in the realm of integrated circuits.
Conclusion
Christophe Athanassiou's work exemplifies the spirit of innovation in the field of integrated circuits. His contributions, particularly in the area of built-in self-test procedures, highlight the importance of reliability and functionality in modern technology.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
