The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 04, 2022
Filed:
Apr. 13, 2021
Nxp Usa, Inc., Austin, TX (US);
Christophe Athanassiou, Saint-Laurent du Var, FR;
Jerome Mallet, Bouillargues, FR;
Estelle Nguyen, Antibes, FR;
NXP USA, Inc., Austin, TX (US);
Abstract
An integrated circuit and a method of performing a built-in-self-test (BIST) procedure in an integrated circuit. The integrated circuit includes a plurality of radio circuits and a switching network for performing a built-in-self-test (BIST) procedure. The switching network includes a plurality of combiners, a plurality of transmitter connection switches, a combiner switch, a splitter switch, a plurality of splitters and a plurality of receiver connection switches. The switching network may also include a splitter bypass switch and/or a combiner bypass switch. The components of the switching network may operate to route signals between outputs and inputs of the radio circuit to implement the built-in-self-test procedure in one or more modes involving either parallel or sequential testing of the components of the radio circuits. A diagnostic mode is also envisaged.