Neubeuern, Germany

Christian Schleith

USPTO Granted Patents = 3 

Average Co-Inventor Count = 3.3

ph-index = 1

Forward Citations = 3(Granted Patents)


Company Filing History:


Years Active: 2015-2024

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3 patents (USPTO):Explore Patents

Title: Christian Schleith: Innovator in Surface Inspection Technology

Introduction

Christian Schleith is a notable inventor based in Neubeuern, Germany. He has made significant contributions to the field of surface inspection technology, holding a total of 3 patents. His work focuses on developing systems and methods that enhance the accuracy and efficiency of surface defect detection.

Latest Patents

One of his latest patents is a surface inspection system designed to capture surface defects. This system includes a camera system, an illumination system with multiple light sources, and an evaluation system. The evaluation system assesses brightness and color distribution in images captured by the camera, identifying surface defects as local deviations in brightness or color. Another significant patent is a method for determining exposure time for 3D recordings. This method involves projecting a pattern onto an object and recording the reflected light. It aims to improve the accuracy of 3D coordinate determination by adjusting exposure time based on the mean greyscale value of the recorded image.

Career Highlights

Christian has worked with prominent companies in the industry, including Carl Zeiss Industrielle Messtechnik GmbH and Steinbichler Optotechnik GmbH. His experience in these organizations has contributed to his expertise in surface inspection technologies.

Collaborations

Throughout his career, Christian has collaborated with notable professionals such as Horst Winterberg and Marcus Steinbichler. These collaborations have further enriched his work and innovations in the field.

Conclusion

Christian Schleith is a distinguished inventor whose work in surface inspection technology has led to significant advancements in the industry. His innovative patents and collaborations reflect his commitment to enhancing the accuracy of surface defect detection.

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