The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 01, 2020
Filed:
Feb. 01, 2018
Carl Zeiss Industrielle Messtechnik Gmbh, Oberkochen, DE;
Christian Schleith, Neubeuern, DE;
Tom Jaeckel, Rosenheim, DE;
Alexander Frey, Bernau a. Chiemsee, DE;
Markus Basel, Raubling, DE;
Carl Zeiss Industrielle Messtechnik GmbH, Oberkochen, DE;
Abstract
A method for determining an exposure, in particular an exposure time, for a recording in a method for determining the 3D coordinates of an object is provided, in which a pattern is projected onto the object and the light reflected by the object is recorded. To improve such a method, a recording of the object is produced with a predetermined exposure, in particular exposure time. A mask image of this recording is produced, in which mask image the regions of the object lying within the measurement volume are depicted. The exposure, in particular the exposure time, for the recording is determined depending on the predetermined exposure, in particular exposure time, depending on the mean greyscale value in the regions, lying within the measurement volume, of the recording with a predetermined exposure and depending on an ideal greyscale value.