Carl Zeiss Industrielle Messtechnik Gmbh

Steinbichler Optotechnik Gmbh

Christian Schleith

Marcus Steinbichler

Alexander Frey

Béla Pontai

Markus Basel

Horst Winterberg

Tom Jaeckel

Stefan Dieball

A surface inspection system for capturing surface defects of a surface to be checked, includes a camera system, an illumination system including one or more light sources, and an evaluation system. The evaluation system evaluates a brightness and/or color distribution of the surface to be checked in at least one image captured by the camera system and captures surface defects of the surface to be checked as local deviations in the brightness and/or color. The evaluation system is configured to assess a local deviation in the brightness and/or color as a surface defect when the local deviation appears brighter in at least one first subregion and darker in at least one second subregion than a surface region surrounding the local deviation, and/or different colors are dominant in different subregions.

Surface inspection system

A method for determining an exposure, in particular an exposure time, for a recording in a method for determining the 3D coordinates of an object is provided, in which a pattern is projected onto the object and the light reflected by the object is recorded. To improve such a method, a recording of the object is produced with a predetermined exposure, in particular exposure time. A mask image of this recording is produced, in which mask image the regions of the object lying within the measurement volume are depicted. The exposure, in particular the exposure time, for the recording is determined depending on the predetermined exposure, in particular exposure time, depending on the mean greyscale value in the regions, lying within the measurement volume, of the recording with a predetermined exposure and depending on an ideal greyscale value.

Method for determining the exposure time for a 3D recording

A method serves the detection of surface defects of a component. The surface of the component () is radiated from the side with light from a light source ('). The light radiated back from the surface of the component () is detected by a sensor. To improve such a method, only a rear region (&#x2032;) of the surface of the component () is radiated with light from the light source (&#x2032;) and/or only the light radiated back from a rear region (&#x2032;) of the surface of the component () is detected by the sensor and/or evaluated by an evaluation device FIG.).

Method and device for the detection of surface defects of a component

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Neubeuern, Germany

Christian Schleith