The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 24, 2015

Filed:

Aug. 08, 2008
Applicants:

Christian Schleith, Neubeuern, DE;

Horst Winterberg, Bad Feilnbach, DE;

Marcus Steinbichler, Neubeuern, DE;

Inventors:

Christian Schleith, Neubeuern, DE;

Horst Winterberg, Bad Feilnbach, DE;

Marcus Steinbichler, Neubeuern, DE;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 21/00 (2006.01); G01N 21/88 (2006.01);
U.S. Cl.
CPC ...
G01N 21/8806 (2013.01);
Abstract

A method serves the detection of surface defects of a component. The surface of the component () is radiated from the side with light from a light source ('). The light radiated back from the surface of the component () is detected by a sensor. To improve such a method, only a rear region (′) of the surface of the component () is radiated with light from the light source (′) and/or only the light radiated back from a rear region (′) of the surface of the component () is detected by the sensor and/or evaluated by an evaluation device FIG.).


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