Choonshik Leem

Title: Choonshik Leem - Innovator in Semiconductor Technology

Introduction

Choonshik Leem is an inventor based in Suwon-si, South Korea. He has made significant contributions to the field of semiconductor technology, particularly in image processing and wafer abnormality detection. Although he currently holds no granted patents, his innovative ideas are reflected in his latest patent applications.

Latest Patent Applications

Choonshik Leem's latest patent applications include:

1. **IMAGE PROCESSING FOR ON-CELL OVERLAY MEASUREMENT** - This application describes a parameter optimization method that involves receiving multiple SEM images corresponding to various positions on a semiconductor wafer. The method includes determining a primary optimization parameter set based on these images, clustering them based on image attributes, and establishing a secondary optimization parameter set for each cluster.

2. **WAFER ABNORMALITY DETECTION METHOD AND A SEMICONDUCTOR DEVICE MANUFACTURING METHOD USING THE SAME** - This application outlines a wafer abnormality detection method that calculates a residual spectrum between a measured spectrum and a predicted spectrum for a wafer. It also incorporates machine learning techniques to assess whether the measurement data is abnormal.

Conclusion

Choonshik Leem is an innovative inventor whose work in semiconductor technology showcases his expertise in image processing and wafer detection methods. His latest patent applications reflect his commitment to advancing the field, even as he seeks to secure his first granted patents.