This inventor holds 2 USPTO granted patents. Top assignee: Teradyne, Inc.. Active years: 2003-2015.
Company Filing History:
Years Active: 2003-2015
Title: Chiyi Jin: Innovator in Calibration and Timing Measurement Technologies
Introduction
Chiyi Jin is a notable inventor based in Thousand Oaks, CA, who has made significant contributions to the field of calibration and timing measurement technologies. With a total of 2 patents to his name, Jin's work has advanced the capabilities of automatic test equipment, particularly in the semiconductor industry.
Latest Patents
One of Chiyi Jin's latest patents is a calibration device designed for use in the calibration of test systems with multiple channels. This apparatus includes a device interface that connects to a socket for receiving a device under test. It features multiple circuit paths that are connectable to corresponding channels of the test system, allowing for efficient signal calibration. The configuration enables signals to pass through various circuit paths during calibration, enhancing the accuracy of the testing process.
Another significant patent is related to an automatic test equipment timing measurement unit and method. This invention includes a computer workstation and pin electronics circuitry that connects a semiconductor device to the computer. The circuitry comprises multiple channels, each equipped with timing circuitry that responds to programmed timing information. This setup allows for real-time timing measurement data to be produced in parallel, significantly improving the testing efficiency of semiconductor devices.
Career Highlights
Chiyi Jin is currently employed at Teradyne, Inc., a leading company in automatic test equipment. His role involves developing innovative solutions that enhance the performance and reliability of testing systems. Jin's expertise in calibration and timing measurement has positioned him as a valuable asset to his team and the industry.
Collaborations
Chiyi Jin has collaborated with several talented individuals in his field, including Benjamin J. Brown and Erik V. Hultine. These collaborations have fostered an environment of innovation and have contributed to the successful development of advanced testing technologies.
Conclusion
Chiyi Jin's contributions to calibration and timing measurement technologies have made a significant impact on the semiconductor testing industry. His innovative patents and collaborative efforts continue to drive advancements in automatic test equipment.