The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 20, 2015

Filed:

Jun. 07, 2013
Applicant:

Teradyne, Inc., North Reading, MA (US);

Inventors:

Gerald H. Johnson, Andover, MN (US);

Babak Nikoomanesh, Westlake Village, CA (US);

Chiyi Jin, Thousand Oaks, CA (US);

Wolfgang Maichen, Regensburg, DE;

Assignee:

Teradyne, Inc., North Reading, MA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/00 (2006.01); G01R 35/00 (2006.01); G01R 31/319 (2006.01);
U.S. Cl.
CPC ...
G01R 35/005 (2013.01); G01R 31/3191 (2013.01);
Abstract

An example apparatus is for use in calibration of a test system having multiple channels and a socket for receiving a device under test. The example apparatus includes a device interface that is connectable to the socket; and multiple circuit paths, where each circuit path is connectable, through the device interface, to a corresponding channel of the test system and being connected to a common node. The example apparatus is configured so that, during calibration, signals either (i) each pass from the test system, through one of the multiple circuit paths, and back to the test system through others of the multiple circuit paths, or (ii) each pass from the test system, through the others of the multiple circuit paths, and back to the test system through the one of the multiple circuit paths.


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