Chu-Pei, Taiwan

Chiu-Wang Chen

This inventor holds 1 USPTO granted patent. Top assignee: Mpi Corporation. Active years: 2022.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Chiu-Wang Chen. Retrieved from https://idiyas.com/inventor/chiu-wang-chen-cz7owq7x

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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% Patents Active = 100.0

Average Co-Inventor Count = 3.0

ph-index = 1


Company Filing History:


Years Active: 2022

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1 patent (USPTO):Explore Patents

Title: The Innovations of Chiu-Wang Chen

Introduction

Chiu-Wang Chen is a notable inventor based in Chu-Pei, Taiwan. He has made significant contributions to the field of optical inspection systems. His innovative approach has led to the development of a unique system that enhances the efficiency of inspecting light-emitting elements.

Latest Patents

Chiu-Wang Chen holds a patent for an optical inspection system. This system includes a brightness inspection module for assessing the brightness of a light-emitting element. Additionally, it features an integrated inspection module that evaluates the near-field optical characteristics and beam quality factor of the light-emitting element. Furthermore, a far-field inspection module is included to inspect the far-field optical characteristics of the light-emitting element. This design is space-saving and effectively reduces the distance and time required for the movement of the device under test.

Career Highlights

Chiu-Wang Chen is currently employed at Mpi Corporation, where he continues to innovate and develop advanced optical inspection technologies. His work has been instrumental in improving the efficiency and effectiveness of optical inspections in various applications.

Collaborations

Chiu-Wang Chen collaborates with talented individuals such as Ping-Ying Wu and Yung-Chin Liu. Their combined expertise contributes to the advancement of optical inspection technologies.

Conclusion

Chiu-Wang Chen's contributions to the field of optical inspection systems demonstrate his commitment to innovation and excellence. His patented technology not only enhances inspection processes but also showcases the potential for further advancements in the industry.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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